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News Details
Workshop on 3D Ultrastructural Imaging using FIB-SEM
Electron Microscope Facility, AIIMS New Delhi
The
Electron Microscope Facility, AIIMS New Delhi,
is organizing a
two-day workshop on 3D Ultrastructural Imaging
using Focused Ion Beam–Scanning Electron Microscopy
(FIB-SEM)
on 18–19 September 2026.
This workshop is specially designed for
Faculties and Scientists interested in
advanced electron microscopy, 3D volume imaging,
ultrastructural characterization and advanced imaging
workflows for biological specimens.
The program combines
lectures and hands-on training,
providing participants with practical exposure to
FIB-SEM-based 3D volume microscopy, sample preparation,
cryogenic workflows, correlative imaging, image
processing and 3D reconstruction.
Participants will gain exposure to the facility's
Cryo multi-Plasma integrated fluorescence
Focused Ion Beam–Scanning Electron Microscope
(FIB-SEM), providing advanced capabilities
for cryo imaging, correlative microscopy and
high-resolution 3D ultrastructural analysis.
18–19 September 2026
Faculties & Scientists
25 Participants
Registration is open and participation is
free of cost.
Only 25 seats are available.
Last Date for Registration:
31 August 2026
Electron Microscope Facility
Workshop on 3D Ultrastructural Imaging
FIB-SEM
Advanced Cryo FIB-SEM Facility
Workshop Covers
Date
Eligibility
Available Seats
Free Registration
Venue
Department of Anatomy, AIIMS New Delhi
Convergence Block, AIIMS, New Delhi
